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Description
◎ Wide dynamic range enables measurement of large aberrations that are difficult to measure with conventional interferometers.
◎ Since measurement is not affected by interferability, inspection can be performed using various light sources (LD, LED, etc.) and wavelengths.
◎ Compact and lightweight design allows easy integration into a wide variety of equipment and systems.
◎ Highly resistant to vibration and temperature variations, ensuring stable measurement even in production environments.
◎ System configuration is simple and flexible using GigE or USB 3.0 interfaces.
◎ Suitable sensors and system solutions can be proposed according to customer application requirements.
◎ Since measurement is not affected by interferability, inspection can be performed using various light sources (LD, LED, etc.) and wavelengths.
◎ Compact and lightweight design allows easy integration into a wide variety of equipment and systems.
◎ Highly resistant to vibration and temperature variations, ensuring stable measurement even in production environments.
◎ System configuration is simple and flexible using GigE or USB 3.0 interfaces.
◎ Suitable sensors and system solutions can be proposed according to customer application requirements.
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