Portable X-Ray Residual Stress Analyzer

◎ Measurement items: Residual stress, Full width at half maximum, and retained austenite.
◎ Full diffraction rings can be obtained on two-dimensional detector.
◎ Crystal structure information such as large crystal grains and crystal orientation can be displayed.
◎ Low power X-ray output (30 kV, 1.6 mA).
◎ Easy set up and simple operation.
◎ Easy and fast X-ray tube exchange by users: enables a greater range of materials to be measured – tube target’s available include Cr, V, Cu, Co, Mn.
◎ Easy to carry and measure in the field because of its portability.

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