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Description
The In-tray Inspection Solution is a product designed specifically for tray-in/tray-out packaging equipment. This solution can detect chips as small as 2 x 2mm within the tray, distinguishing between single chips, stacked chips, and tilted chips, which may pose risks to subsequent processes. The solution utilizes TCP/IP communication handshake and is compatible with most semiconductor equipments.
The BIM-Intray, typically paired with the C2100-200E or C2100-300E has been reliably serving numerous production lines of leading industry manufacturers for years. This standalone system integrates into the input/output bins of various tray-to-tray equipment, with total costs less than half that of other laser vision products. Benano offers a free demo, and we warmly invite equipment as well as packaging and testing manufacturers to contact us for testing
The BIM-Intray, typically paired with the C2100-200E or C2100-300E has been reliably serving numerous production lines of leading industry manufacturers for years. This standalone system integrates into the input/output bins of various tray-to-tray equipment, with total costs less than half that of other laser vision products. Benano offers a free demo, and we warmly invite equipment as well as packaging and testing manufacturers to contact us for testing
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