CHRocodile CLS 2

3D Confocal line sensor for high-speed inspection in smart factories

The CHRocodile CLS 2.0 enables you to measure complex surfaces with high slopes at very high speed and without shadowing. The high-speed confocal line sensor measures with utmost precision and high resolution on almost all materials, even difficult ones. Its versatility enables a wide variety of measuring tasks.

What's more, the CHRocodile CLS 2.0 helps to reduce operational costs, saves time, and ensures 100% control in industry 4.0 applications. Last but not least, the high-speed confocal line sensor CHRocodile CLS 2.0 is much smaller and lighter than alternative devices.

Applications for CHRocodile CLS 2.0 in the area of semiconductors: Wire bonding inspection, bump measurements, packaging wafer edge inspection, dicing groove inspection, defects, die cracks and photomask lithography.

More applications for Consumer electronics: Housing topography inspection, inspection of slightly, medium and highly curved surfaces, chamfer and spline inspection, diameter/hole/stepped surface inspection, cosmetic inspection with additional height data.

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