QPM

HAMAMATSU QPM (Quantitative Phase Microscope) delivers non-contact 3D surface metrology based on advanced white-light interferometry technology. Offering a vertical resolution of up to 0.5 nm, the system provides accurate measurement of nanoscale surface structures. Its high-speed, large-area inspection capability and outstanding repeatability make it an ideal solution for semiconductor wafers, advanced packaging, optical components, precision manufacturing, and advanced material applications, helping improve process control, product quality, and manufacturing efficiency.

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