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Dual Camera Structured Light 3D Vision Module

Model: C2100E

Category: Smart Manufacturing & System Integration

Exhibitor:

BENANO INC.

Booth No: N1214

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Description
The RJ45 communication interface enables the C2100E to integrate seamlessly with a wide range of automation equipment. One of its most common applications is intray inspection. In semiconductor packaging and testing facilities, the C2100E is widely used for chip counting and detecting stacking or tilted chips within trays, helping ensure quality control throughout the packaging and testing process.

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