Intelligent inspection machine

Integrated testing system | Optical testing equipment
https://www.buenooptics.com/en/product/6at
Modular design of automatic optical inspection to meet different market demands.
Choose different specifications of light sources, cameras, and lenses according to your needs, and choose multi-axis displacement platforms of different sizes for the measurement objects.

→ AI Defective Images and Deep Learning
We have independently developed machine vision integrated image processing and AI image deep learning, which can perform CNN deep learning on individual defect images to improve detection accuracy. This can be applied to defect detection of various material objects or semiconductor defect detection.

→ Data digitization
Automatically capture and identify defects on the product surface, automatically classify and count them, and the final data results can be uploaded to the MES system

→ Diversity Automation Integration
The system integrates high-speed cameras, optical systems and high-precision optical ruler XY electric displacement platform. The system can easily integrate robotic arms to improve efficiency

→ Microscope auto focus system
Applied in the semiconductor wafer field to solve the problem of shallow depth of field and difficulty in focusing of high-magnification microscopic images, which makes image judgment difficult

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